Correlation light-field microscopy

We present a novel approach to three-dimensional optical microscopy, named correlation light-field microscopy (CLM). This approach is based on correlation plenoptic imaging and exploits correlations between intensity fluctuations, intrinsic in chaotic light, to retrieve both spatial information about the intensity distribution of light on the sample and angular information about the directions of propagation of the light rays. Such a plenoptic (or light-field ) information about the sample enables an extension of the natural depth of field, while avoiding the intrinsic loss of spatial resolution occurring in conventional light-field microscopy. We discuss the capability of CLM of refocusing out-of-focus planes of the sample, paving the way to scanning-free three-dimensional reconstruction while keeping the at-focus resolution at the diffraction limit showing a brief comparison with light-field microscopy. Finally we discuss the perspective of improvements in CLM acquisition speed by the integration of SPAD array sensors in the setup.