In this work, the electrodeposition of smooth bismuth thin films was investigated. Bismuth is known for its peculiar magnetic, thermal and electrical properties but the deposition of a uniform and flat film, which are features required for its application in electronic devices, is not trivial. We investigated the morphology of Bi film electrodeposited at increasing overpotential on a monocrystalline silver electrode. We found that the presence of an underpotential deposition (UPD) layer, previously deposited on the surface, drives the overpotential deposition to a smoother growth. The samples were investigated by means of different techniques: atomic force microscopy (AFM) and scanning electron microscopy combined with energy dispersive X-ray spectroscopy (SEM-EDS) to study the morphology, X-ray photoemission spectroscopy (XPS) to assess the composition and X-ray diffraction spectroscopy (XRD) to check the crystallinity. We also found an unexpected form birefringence behaviour, which has been preliminary investigated with cross polarized light microscopy (CPL).

Underpotential-Assisted Electrodeposition of Highly Crystalline and Smooth Thin Film of Bismuth

Picca R. A.;Cioffi N.;
2020

Abstract

In this work, the electrodeposition of smooth bismuth thin films was investigated. Bismuth is known for its peculiar magnetic, thermal and electrical properties but the deposition of a uniform and flat film, which are features required for its application in electronic devices, is not trivial. We investigated the morphology of Bi film electrodeposited at increasing overpotential on a monocrystalline silver electrode. We found that the presence of an underpotential deposition (UPD) layer, previously deposited on the surface, drives the overpotential deposition to a smoother growth. The samples were investigated by means of different techniques: atomic force microscopy (AFM) and scanning electron microscopy combined with energy dispersive X-ray spectroscopy (SEM-EDS) to study the morphology, X-ray photoemission spectroscopy (XPS) to assess the composition and X-ray diffraction spectroscopy (XRD) to check the crystallinity. We also found an unexpected form birefringence behaviour, which has been preliminary investigated with cross polarized light microscopy (CPL).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11586/282805
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