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EnglishIn the present contribution Angle Resolved X-ray Photoelectron Spectroscopy (AR-XPS) was proposed as useful tool to address the challenge of probing the near-surface region of bio-active sensors surface. A model bio-functionalized surface was characterized by Parallel AR-XPS and commercially available Thermo Avantage-ARProcess software was used to generate non-destructive concentration depth profiles of protein functionalized silicon oxide substrates. At each step of the functionalization procedure, the surface composition, the overlayer thickness, the in-depth organization and the in-plane homogeneity were evaluated. The critical discussion of the generated profiles highlighted the relevance of the information provided by PAR-XPS technique.
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| Titolo: | Non-destructive depth profile reconstruction of bio-engineered surfaces by parallel-angle-resolved X-ray photoelectron spectroscopy |
| Autori: | |
| Data di pubblicazione: | 2013 |
| Rivista: | |
| Abstract: | In the present contribution Angle Resolved X-ray Photoelectron Spectroscopy (AR-XPS) was proposed as useful tool to address the challenge of probing the near-surface region of bio-active sensors surface. A model bio-functionalized surface was characterized by Parallel AR-XPS and commercially available Thermo Avantage-ARProcess software was used to generate non-destructive concentration depth profiles of protein functionalized silicon oxide substrates. At each step of the functionalization procedure, the surface composition, the overlayer thickness, the in-depth organization and the in-plane homogeneity were evaluated. The critical discussion of the generated profiles highlighted the relevance of the information provided by PAR-XPS technique. |
| Handle: | http://hdl.handle.net/11586/132303 |
| Appare nelle tipologie: | 1.1 Articolo in rivista |
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