The correlation between the optical properties and microstructural parameters of organic semiconductor polymeric thin films is investigated by spectroscopic ellipsometry. Different poly(arylenephenylene)-based films have been deposited by spincoating. The effect of deposition conditions on the microstructure and, hence, optical constants of the polymeric thin films and the dependence of the optical properties and pi-pi* transition on the structure of the chain backbone are studied. (C) 2003 Elsevier Science B.V. All rights reserved.
Spectroscopic ellipsometry for characterization of organic semiconductor polymeric thin films
BABUDRI, Francesco;FARINOLA, Gianluca Maria;
2003-01-01
Abstract
The correlation between the optical properties and microstructural parameters of organic semiconductor polymeric thin films is investigated by spectroscopic ellipsometry. Different poly(arylenephenylene)-based films have been deposited by spincoating. The effect of deposition conditions on the microstructure and, hence, optical constants of the polymeric thin films and the dependence of the optical properties and pi-pi* transition on the structure of the chain backbone are studied. (C) 2003 Elsevier Science B.V. All rights reserved.File in questo prodotto:
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