Transmission and reflectance spectra of fullerite C-60 thin films deposited on quartz and Si substrates are presented. An Urbach tail of states is present below the absorption edge due to the disordered structure of films. Photoluminescence (PL) spectra have been measured from 10 to 300 K. The recombination line of a self-trapped exciton polaron and its phonon replicas are present in the PL spectra.
Optical characterization of fullerite C-60 thin films
VALENTINI, Antonio
1996-01-01
Abstract
Transmission and reflectance spectra of fullerite C-60 thin films deposited on quartz and Si substrates are presented. An Urbach tail of states is present below the absorption edge due to the disordered structure of films. Photoluminescence (PL) spectra have been measured from 10 to 300 K. The recombination line of a self-trapped exciton polaron and its phonon replicas are present in the PL spectra.File in questo prodotto:
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