Structural investigations at high temperature were carried out on compound Li2VOSiO4, which crystallises with a natisite-type structure. Unit-cell parameters were measured and diffracted intensities collected at regular intervals in the temperature range 25-500°C using single crystal X-ray diffraction techniques. Thermal expansion coefficients showed positive expansion of lattice constants, greater along the c direction, and of cell volume. Reversibility of thermal expansion in the investigated temperature range was checked by measuring unit-cell parameters after the crystal was cooled down from 500°C to room temperature. Structure refinements revealed that the [VOSiO4]n2- layers are almost rigid and that the most relevant modifications occur at the intercalated ion layer. © by Oldenbourg Wissenschaftsverlag.
High temperature structural behaviour of Li2VOSiO4
Michele Zema
;
2007-01-01
Abstract
Structural investigations at high temperature were carried out on compound Li2VOSiO4, which crystallises with a natisite-type structure. Unit-cell parameters were measured and diffracted intensities collected at regular intervals in the temperature range 25-500°C using single crystal X-ray diffraction techniques. Thermal expansion coefficients showed positive expansion of lattice constants, greater along the c direction, and of cell volume. Reversibility of thermal expansion in the investigated temperature range was checked by measuring unit-cell parameters after the crystal was cooled down from 500°C to room temperature. Structure refinements revealed that the [VOSiO4]n2- layers are almost rigid and that the most relevant modifications occur at the intercalated ion layer. © by Oldenbourg Wissenschaftsverlag.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
