We present the beam test results of single-sided silicon microstrip detectors, with different substrate resistivities. The effects of radiation damage are studied for a detector irradiated to a fluence of 2.4 x 10(14) n/cm(2). The detectors are read out with the APV6 chip, which is compatible with the 40 MHz LHC clock, The performance of different detectors and readout modes are studied in terms of signal-to-noise ratio and efficiency. (C) 2002 Elsevier Science B.V. All rights reserved.

Study of radiation damage and substrate resistivity effects from beam test of silicon microstrip detectors using LHC readout electronics

SELVAGGI, Giovanna
2002-01-01

Abstract

We present the beam test results of single-sided silicon microstrip detectors, with different substrate resistivities. The effects of radiation damage are studied for a detector irradiated to a fluence of 2.4 x 10(14) n/cm(2). The detectors are read out with the APV6 chip, which is compatible with the 40 MHz LHC clock, The performance of different detectors and readout modes are studied in terms of signal-to-noise ratio and efficiency. (C) 2002 Elsevier Science B.V. All rights reserved.
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11586/44444
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? 3
social impact