Progress in the production of CsI and diamond thin film photocathodes

Nitti, Ma; Nappi, E; Valentini, Antonio; Benedic, F; Bruno, P; Cicala, G.

doi:10.1016/j.nima.2005.08.084

CINECA IRIS Institutional Research Information System

IRIS è la soluzione IT che facilita la raccolta e la gestione dei dati relativi alle attività e ai prodotti della ricerca. Fornisce a ricercatori, amministratori e valutatori gli strumenti per monitorare i risultati della ricerca, aumentarne la visibilità e allocare in modo efficace le risorse disponibili.

The comparison between the quantum efficiency of photocathodes coated with thin CsI films obtained by thermal evaporation and, for the first time, by Ar ion-beam sputtering is reported. The sensitivity of photocathodes has been Found to be strongly dependent on the morphology and roughness of the evaporated and sputtered CsI films. The effect of surface roughness on four different substrates has been investigated and is discussed. Preliminary measurement results on the photoeinissivity of diamond films are also given. (c) 2005 Elsevier B.V. All rights reserved.

Scheda prodotto non validato

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Titolo:	Progress in the production of CsI and diamond thin film photocathodes
Autori:	Nitti MA Nappi E VALENTINI, Antonio Benedic F Bruno P Cicala G. mostra contributor esterni nascondi contributor esterni
Data di pubblicazione:	2005
Rivista:	NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT
Citazione:	Progress in the production of CsI and diamond thin film photocathodes / Nitti MA; Nappi E; Valentini A; Benedic F; Bruno P; Cicala G. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. - ISSN 0168-9002. - 553:1-2(2005), pp. 157-164.
Abstract:	The comparison between the quantum efficiency of photocathodes coated with thin CsI films obtained by thermal evaporation and, for the first time, by Ar ion-beam sputtering is reported. The sensitivity of photocathodes has been Found to be strongly dependent on the morphology and roughness of the evaporated and sputtered CsI films. The effect of surface roughness on four different substrates has been investigated and is discussed. Preliminary measurement results on the photoeinissivity of diamond films are also given. (c) 2005 Elsevier B.V. All rights reserved.
Handle:	http://hdl.handle.net/11586/21636
Appare nelle tipologie:	1.1 Articolo in rivista

File in questo prodotto:

Non ci sono file associati a questo prodotto.

Utilizza questo identificativo per citare o creare un link a questo documento:
http://hdl.handle.net/11586/21636

Citazioni

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.