CINECA IRIS Institutional Research Information System
IRIS è la soluzione IT che facilita la raccolta e la gestione dei dati relativi alle attività e ai prodotti della ricerca. Fornisce a ricercatori, amministratori e valutatori gli strumenti per monitorare i risultati della ricerca, aumentarne la visibilità e allocare in modo efficace le risorse disponibili.
EnglishThe comparison between the quantum efficiency of photocathodes coated with thin CsI films obtained by thermal evaporation and, for the first time, by Ar ion-beam sputtering is reported. The sensitivity of photocathodes has been Found to be strongly dependent on the morphology and roughness of the evaporated and sputtered CsI films. The effect of surface roughness on four different substrates has been investigated and is discussed. Preliminary measurement results on the photoeinissivity of diamond films are also given. (c) 2005 Elsevier B.V. All rights reserved.
Progress in the production of CsI and diamond thin film photocathodes / Nitti MA; Nappi E; Valentini A; Benedic F; Bruno P; Cicala G. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. - ISSN 0168-9002. - 553:1-2(2005), pp. 157-164.
Scheda prodotto non validato
Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo
| Titolo: | Progress in the production of CsI and diamond thin film photocathodes |
| Autori: | |
| Data di pubblicazione: | 2005 |
| Rivista: | |
| Citazione: | Progress in the production of CsI and diamond thin film photocathodes / Nitti MA; Nappi E; Valentini A; Benedic F; Bruno P; Cicala G. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. - ISSN 0168-9002. - 553:1-2(2005), pp. 157-164. |
| Abstract: | The comparison between the quantum efficiency of photocathodes coated with thin CsI films obtained by thermal evaporation and, for the first time, by Ar ion-beam sputtering is reported. The sensitivity of photocathodes has been Found to be strongly dependent on the morphology and roughness of the evaporated and sputtered CsI films. The effect of surface roughness on four different substrates has been investigated and is discussed. Preliminary measurement results on the photoeinissivity of diamond films are also given. (c) 2005 Elsevier B.V. All rights reserved. |
| Handle: | http://hdl.handle.net/11586/21636 |
| Appare nelle tipologie: | 1.1 Articolo in rivista |
File in questo prodotto:
http://hdl.handle.net/11586/21636
Copyright © 2020