To monitor the density of photo-generated charge carriers on a semiconductor surface, we demonstrate a detectorless imaging system based on the analysis of the optical feedback in terahertz quantum cascade lasers. Photo-excited free electron carriers are created in high resistivity n-type silicon wafers via low power (ffi40 mW/cm2) continuous wave pump laser in the near infrared spectral range. A spatial light modulator allows to directly reconfigure and control the photo-patterned intensity and the associated free-carrier density distribution. The experimental results are in good agreement with the numerical simulations.

IMAGING OF FREE CARRIERS IN SEMICONDUCTORS VIA OPTICAL FEEDBACK IN THZ QUANTUM CASCADE LASERS

DABBICCO, Maurizio;SCAMARCIO, Gaetano
2014-01-01

Abstract

To monitor the density of photo-generated charge carriers on a semiconductor surface, we demonstrate a detectorless imaging system based on the analysis of the optical feedback in terahertz quantum cascade lasers. Photo-excited free electron carriers are created in high resistivity n-type silicon wafers via low power (ffi40 mW/cm2) continuous wave pump laser in the near infrared spectral range. A spatial light modulator allows to directly reconfigure and control the photo-patterned intensity and the associated free-carrier density distribution. The experimental results are in good agreement with the numerical simulations.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11586/133155
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