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EnglishOptical and photoemissive properties of CsI photocathodes (PCs) grown at two different evaporation rates (1 and 0.04nm/s) have been investigated. The surface morphology of 300-nm-thick CsI films was also studied by means of atomic force microscopy. After 24-h exposure to humid air, properties of PCs grown at the slowest evaporation rate resulted affected more than those obtained at the fastest rate, making this latter more adequate for the photocathode preparation. (C) 2004 Elsevier B.V. All rights reserved.
Influence of the film deposition rate and humidity on the properties of thin CsI photocathodes / Nitti MA; Senesi GS; Liotino A; Nappi E; Valentini A; Singh BK. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. - ISSN 0168-9002. - 523:3(2004), pp. 323-333.
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| Titolo: | Influence of the film deposition rate and humidity on the properties of thin CsI photocathodes |
| Autori: | |
| Data di pubblicazione: | 2004 |
| Rivista: | |
| Citazione: | Influence of the film deposition rate and humidity on the properties of thin CsI photocathodes / Nitti MA; Senesi GS; Liotino A; Nappi E; Valentini A; Singh BK. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. - ISSN 0168-9002. - 523:3(2004), pp. 323-333. |
| Abstract: | Optical and photoemissive properties of CsI photocathodes (PCs) grown at two different evaporation rates (1 and 0.04nm/s) have been investigated. The surface morphology of 300-nm-thick CsI films was also studied by means of atomic force microscopy. After 24-h exposure to humid air, properties of PCs grown at the slowest evaporation rate resulted affected more than those obtained at the fastest rate, making this latter more adequate for the photocathode preparation. (C) 2004 Elsevier B.V. All rights reserved. |
| Handle: | http://hdl.handle.net/11586/105398 |
| Appare nelle tipologie: | 1.1 Articolo in rivista |
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