Sfoglia per Autore
Generalized Bell'sinequalities
1977-01-01 Schiavulli, Luigi
Further consequences of Einstein locality
1979-01-01 Schiavulli, Luigi; Selleri, F.
Optical constants of silicon films deposited by the r.f. glow discharge of SiCl4
1981-01-01 Augelli, V; Murri, R; Schiavulli, Luigi; Bruno, G; Capezzuto, P; Cramarossa, F; Evangelisti, P; Fortunato, G.
Optical and Electrical properties of glow-discharge silicon films
1982-01-01 Augelli, V; Murri, R; Schiavulli, Luigi
Effects of the dopants on the electrical conductivity and Hall mobility in Si:H,Cl films
1985-01-01 Augelli, V; Ligonzo, Teresa; Murri, R; Schiavulli, Luigi
Field-Effect measurements in hydrogenated and chlorinated amorphous-silicon films
1985-01-01 Augelli, V; Dilecce, G; Murri, R; Schiavulli, Luigi
Photoconductivity in doped microcrystalline Si:H,Cl Films
1986-01-01 Augelli, V; Ligonzo, Teresa; Murri, R; Schiavulli, Luigi
Evaluation of density of states distribution in amorphous silicon films by photoconductivity measurements
1987-01-01 Augelli, V; Ligonzo, T; Murri, R; Schiavulli, Luigi
Analytical determination of the density-of-gap-states in amorphous semiconductors: Experimental results
1987-01-01 Augelli, V; Berardi, V; Murri, R; Schiavulli, Luigi; Leo, M; Leo, R. A.; Soliani, G.
DENSITY OF STATES IN A-SI-H,CL DETERMINED BY SPACE-CHARGE-LIMITED CURRENTS
1988-01-01 Ligonzo, Teresa; Murri, R; Augelli, V; Schiavulli, Luigi
PHOTOCONDUCTIVITY MEASUREMENTS AS A TOOL FOR THE EVALUATION OF THE DENSITY OF STATES IN AMORPHOUS-SILICON
1988-01-01 Augelli, V; Berardi, V; Murri, R; Schiavulli, Luigi
THE DENSITY OF STATES IN THE MOBILITY GAP OF HALOGENATED AMORPHOUS-SILICON
1989-01-01 Augelli, V; Murri, R; Schiavulli, Luigi
PHOTOVOLTAIC CHARACTERIZATION OF AMORPHOUS HYDROGENATED AND CHLORINATED
1989-01-01 Augelli, V; Ligonzo, Teresa; Murri, R; Schiavulli, Luigi
ELECTRONIC-PROPERTIES OF AMORPHOUS GALLIUM-ARSENIDE DEPOSITED BY REACTIVE SPUTTERING
1989-01-01 Casamassima, G; Ligonzo, Teresa; Murri, R; Pinto, N; Schiavulli, Luigi; Valentini, Antonio
PHOTOVOLTAIC CHARACTERIZATION OF AMORPHOUS HYDROGENATED AND CHLORINATED SILICON FILMS
1989-01-01 Augelli, V; Ligonzo, Teresa; Murri, R; Schiavulli, Luigi
DEPOSITION RATE, ION-BOMBARDMENT AND GAP STATES DENSITY IN GLOW-DISCHARGE A-SI-H,F FILMS
1989-01-01 Murri, R; Schiavulli, Luigi; Bruno, G; Capezzuto, P; Grillo, G.
STRUCTURAL CHARACTERIZATION OF UNHYDROGENATED AMORPHOUS GAAS
1991-01-01 Murri, R; Gozzo, F; Pinto, N; Schiavulli, Luigi; Deblasi, C; Manno, D.
THE DENSITY OF STATES IN THE MOBILITY GAP OF A-SI1-X GEX FILMS
1991-01-01 Gozzo, F; Murri, R; Pinto, N; Schiavulli, Luigi
PHYSICAL-PROPERTIES OF HYDROGENATED AMORPHOUS GALLIUM-ARSENIDE
1991-01-01 Carbone, A; Demichelis, F; Kaniadakis, G; Gozzo, F; Murri, R; Pinto, N; Schiavulli, Luigi; Dellamea, G; Drigo, A; Paccagnella, A.
URBACH TAIL IN AMORPHOUS GALLIUM-ARSENIDE FILMS
1992-01-01 Murri, R; Schiavulli, Luigi; Pinto, N; Ligonzo, Teresa
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Generalized Bell'sinequalities | 1-gen-1977 | Schiavulli, Luigi | |
Further consequences of Einstein locality | 1-gen-1979 | Schiavulli, Luigi; Selleri, F. | |
Optical constants of silicon films deposited by the r.f. glow discharge of SiCl4 | 1-gen-1981 | Augelli, V; Murri, R; Schiavulli, Luigi; Bruno, G; Capezzuto, P; Cramarossa, F; Evangelisti, P; Fortunato, G. | |
Optical and Electrical properties of glow-discharge silicon films | 1-gen-1982 | Augelli, V; Murri, R; Schiavulli, Luigi | |
Effects of the dopants on the electrical conductivity and Hall mobility in Si:H,Cl films | 1-gen-1985 | Augelli, V; Ligonzo, Teresa; Murri, R; Schiavulli, Luigi | |
Field-Effect measurements in hydrogenated and chlorinated amorphous-silicon films | 1-gen-1985 | Augelli, V; Dilecce, G; Murri, R; Schiavulli, Luigi | |
Photoconductivity in doped microcrystalline Si:H,Cl Films | 1-gen-1986 | Augelli, V; Ligonzo, Teresa; Murri, R; Schiavulli, Luigi | |
Evaluation of density of states distribution in amorphous silicon films by photoconductivity measurements | 1-gen-1987 | Augelli, V; Ligonzo, T; Murri, R; Schiavulli, Luigi | |
Analytical determination of the density-of-gap-states in amorphous semiconductors: Experimental results | 1-gen-1987 | Augelli, V; Berardi, V; Murri, R; Schiavulli, Luigi; Leo, M; Leo, R. A.; Soliani, G. | |
DENSITY OF STATES IN A-SI-H,CL DETERMINED BY SPACE-CHARGE-LIMITED CURRENTS | 1-gen-1988 | Ligonzo, Teresa; Murri, R; Augelli, V; Schiavulli, Luigi | |
PHOTOCONDUCTIVITY MEASUREMENTS AS A TOOL FOR THE EVALUATION OF THE DENSITY OF STATES IN AMORPHOUS-SILICON | 1-gen-1988 | Augelli, V; Berardi, V; Murri, R; Schiavulli, Luigi | |
THE DENSITY OF STATES IN THE MOBILITY GAP OF HALOGENATED AMORPHOUS-SILICON | 1-gen-1989 | Augelli, V; Murri, R; Schiavulli, Luigi | |
PHOTOVOLTAIC CHARACTERIZATION OF AMORPHOUS HYDROGENATED AND CHLORINATED | 1-gen-1989 | Augelli, V; Ligonzo, Teresa; Murri, R; Schiavulli, Luigi | |
ELECTRONIC-PROPERTIES OF AMORPHOUS GALLIUM-ARSENIDE DEPOSITED BY REACTIVE SPUTTERING | 1-gen-1989 | Casamassima, G; Ligonzo, Teresa; Murri, R; Pinto, N; Schiavulli, Luigi; Valentini, Antonio | |
PHOTOVOLTAIC CHARACTERIZATION OF AMORPHOUS HYDROGENATED AND CHLORINATED SILICON FILMS | 1-gen-1989 | Augelli, V; Ligonzo, Teresa; Murri, R; Schiavulli, Luigi | |
DEPOSITION RATE, ION-BOMBARDMENT AND GAP STATES DENSITY IN GLOW-DISCHARGE A-SI-H,F FILMS | 1-gen-1989 | Murri, R; Schiavulli, Luigi; Bruno, G; Capezzuto, P; Grillo, G. | |
STRUCTURAL CHARACTERIZATION OF UNHYDROGENATED AMORPHOUS GAAS | 1-gen-1991 | Murri, R; Gozzo, F; Pinto, N; Schiavulli, Luigi; Deblasi, C; Manno, D. | |
THE DENSITY OF STATES IN THE MOBILITY GAP OF A-SI1-X GEX FILMS | 1-gen-1991 | Gozzo, F; Murri, R; Pinto, N; Schiavulli, Luigi | |
PHYSICAL-PROPERTIES OF HYDROGENATED AMORPHOUS GALLIUM-ARSENIDE | 1-gen-1991 | Carbone, A; Demichelis, F; Kaniadakis, G; Gozzo, F; Murri, R; Pinto, N; Schiavulli, Luigi; Dellamea, G; Drigo, A; Paccagnella, A. | |
URBACH TAIL IN AMORPHOUS GALLIUM-ARSENIDE FILMS | 1-gen-1992 | Murri, R; Schiavulli, Luigi; Pinto, N; Ligonzo, Teresa |
Legenda icone
- file ad accesso aperto
- file disponibili sulla rete interna
- file disponibili agli utenti autorizzati
- file disponibili solo agli amministratori
- file sotto embargo
- nessun file disponibile